FinishAdapt

Sharp

Image 07

Semflex

Marketing Executive

Crosstalk-induced errors are the most common signal-integrity problem. They are induced when two or more nets (wire routes) run parallel to one another for some distance, creating a capacitor between them. This capacitor can transmit a pulse from one net to another. If an aggressor” net switches, this may cause the adjoining victim” net to temporarily assume a different logic value, resulting in unintended logic transitions. The outcome is repeatable failures of certain logic operations.

Virtual Silicon TechnologySunnyvale, CAwww.virtual-silicon.com

Email: marketing@company.com
Mobile: 080-022-0540
Image 08

Cantherm

Online Advertising Manager

Virtual Silicon TechnologySunnyvale, CAwww.virtual-silicon.com

Workers at Hewlett-Packard Co. and elsewhere have shown that a combination of stuck-at, functional and transition/path delay faults may be the most effective test strategy. For deep-submicron chips and high-frequency operation, transition and path delay testing becomes even more critical.

Email: advertising@company.com
Mobile: 056-140-0550
Image 09

Dallas Semiconductor

Web Application Project Manager

Workers at Hewlett-Packard Co. and elsewhere have shown that a combination of stuck-at, functional and transition/path delay faults may be the most effective test strategy. For deep-submicron chips and high-frequency operation, transition and path delay testing becomes even more critical.

The following articles and Web sites offer additional information on design issues and testing challenges of deep-submicron systems-on-chip.

Email: manager@company.com
Mobile: 042-366-1400

Hakko

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  • Bumper Specialties, Inc.
  • MMB Networks
  • Seagate
  • Microwave Technology
Multicomp

mSMD300

The following articles and Web sites offer additional information on design issues and testing challenges of deep-submicron systems-on-chip.

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David DFRobotPLX
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